Defect-induced Surface and Interface Reconstruction in Novel Two-dimensional Materials Revealed by Low Voltage Scanning Transmission Electron Microscopy
WANG Gang;GUO Zeng-Long;NIU Kang-Di;LIN Jun-Hao
Department of Physics, Southern University of Science and Technology, Shenzhen 518055, China
Defect-induced Surface and Interface Reconstruction in Novel Two-dimensional Materials Revealed by Low Voltage Scanning Transmission Electron Microscopy
WANG Gang;GUO Zeng-Long;NIU Kang-Di;LIN Jun-Hao
Department of Physics, Southern University of Science and Technology, Shenzhen 518055, China
摘要Two-dimensional (2D) materials attracted substantial attention due to their extraordinary physical properties resulting from the unique atomic thickness. 2D materials could be considered as material systems with flat surfaces at both sides, while the van der Waals gap is a natural out-of-plane interface between two monolayers. However, defects are inevitably presented and often cause significant surface and interface reconstruction, which modify the physical properties of the materials being investigated. In this review article, we reviewed the effort achieved in probing the defect structures and the reconstruction of surface and interface in novel 2D materials through aberration corrected low voltage scanning transmission electron microscopy (LVSTEM). The LVSTEM technique enables us to unveil the intrinsic atomic structure of defects atom-by-atom, and even directly visualize the dynamical reconstruction process with single atom precision. The effort in understanding the defect structures and their contributions in the surface and interface reconstructions in 2D materials shed light on the origin of their novel physical phenomenon, and also pave the way for defect engineering in future potential applications.
Abstract：Two-dimensional (2D) materials attracted substantial attention due to their extraordinary physical properties resulting from the unique atomic thickness. 2D materials could be considered as material systems with flat surfaces at both sides, while the van der Waals gap is a natural out-of-plane interface between two monolayers. However, defects are inevitably presented and often cause significant surface and interface reconstruction, which modify the physical properties of the materials being investigated. In this review article, we reviewed the effort achieved in probing the defect structures and the reconstruction of surface and interface in novel 2D materials through aberration corrected low voltage scanning transmission electron microscopy (LVSTEM). The LVSTEM technique enables us to unveil the intrinsic atomic structure of defects atom-by-atom, and even directly visualize the dynamical reconstruction process with single atom precision. The effort in understanding the defect structures and their contributions in the surface and interface reconstructions in 2D materials shed light on the origin of their novel physical phenomenon, and also pave the way for defect engineering in future potential applications.
基金资助:The authors would like to acknowledge the support from National Natural Science Foundation of China (No. 11974156), Guangdong International Science Collaboration Project (No. 2019A050510001), and also the assistance of SUSTech Core Research Facilities, especially technical support from Pico-Centre that receives support from Presidential fund and Development and Reform Commission of Shenzhen
WANG Gang;GUO Zeng-Long;NIU Kang-Di;LIN Jun-Hao. Defect-induced Surface and Interface Reconstruction in Novel Two-dimensional Materials Revealed by Low Voltage Scanning Transmission Electron Microscopy[J]. 结构化学, 2020, 39(3): 401-414.
WANG Gang;GUO Zeng-Long;NIU Kang-Di;LIN Jun-Hao. Defect-induced Surface and Interface Reconstruction in Novel Two-dimensional Materials Revealed by Low Voltage Scanning Transmission Electron Microscopy. CHINESE JOURNAL OF STRUCTURAL CHEMISTRY, 2020, 39(3): 401-414.
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